Reliability Characterisation of Electrical and Electronic Systems

Written By Jonathan Swingler
Reliability Characterisation of Electrical and Electronic Systems
  • Publsiher : Elsevier
  • Release : 24 December 2014
  • ISBN : 1782422250
  • Pages : 274 pages
  • Rating : /5 from reviews
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Download or read book entitled Reliability Characterisation of Electrical and Electronic Systems by author: Jonathan Swingler which was release on 24 December 2014 and published by Elsevier with total page 274 pages . This book available in PDF, EPUB and Kindle Format. This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications. Takes a holistic approach to reliability engineering Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation

Reliability Characterisation of Electrical and Electronic Systems

Reliability Characterisation of Electrical and Electronic Systems
  • Author : Jonathan Swingler
  • Publisher : Elsevier
  • Release Date : 2014-12-24
  • Total pages : 274
  • ISBN : 1782422250
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Summary : This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and ...

Reliability Characterisation of Electrical and Electronic Systems

Reliability Characterisation of Electrical and Electronic Systems
  • Author : Jonathan Swingler
  • Publisher : Woodhead Publishing
  • Release Date : 2020-11-15
  • Total pages : 350
  • ISBN : 1782422250
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Summary : The book charts how reliability engineering has moved from the use of sometimes arbitrary standards to an empirical scientific approach of understanding operating conditions, failure mechanisms, the need for testing for a more realistic characterisation and, new for the second edition, includes the monitoring of performance/robustness in the field. ...

Impedance Source Inverters

Impedance Source Inverters
  • Author : Hongpeng Liu,Zichao Zhou,Yuhao Li,Wentao Wu,Jiabao Jiang,Enda Shi
  • Publisher : Springer Nature
  • Release Date : 2020-01-13
  • Total pages : 290
  • ISBN : 1782422250
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Summary : This book focuses on impedance source inverters, discussing their classification, advantages, topologies, analysis methods, working mechanisms, improvements, reliability, and applications. It summarizes methods for suppressing DC-link voltage spikes and duty loss, which can pose a problem for researchers; and presents novel, efficient, steady state and transient analysis methods that are ...

Materials Characterization Using Nondestructive Evaluation NDE Methods

Materials Characterization Using Nondestructive Evaluation  NDE  Methods
  • Author : Gerhard Huebschen,Iris Altpeter,Ralf Tschuncky,Hans-Georg Herrmann
  • Publisher : Woodhead Publishing
  • Release Date : 2016-03-23
  • Total pages : 320
  • ISBN : 1782422250
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Summary : Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) ...

Modeling Characterization and Production of Nanomaterials

Modeling  Characterization and Production of Nanomaterials
  • Author : V Tewary,Y Zhang
  • Publisher : Elsevier
  • Release Date : 2015-03-17
  • Total pages : 554
  • ISBN : 1782422250
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Summary : Nano-scale materials have unique electronic, optical, and chemical properties which make them attractive for a new generation of devices. Part one of Modeling, Characterization, and Production of Nanomaterials: Electronics, Photonics and Energy Applications covers modeling techniques incorporating quantum mechanical effects to simulate nanomaterials and devices, such as multiscale modeling and ...

Reliability and Maintainability RAM Training

Reliability and Maintainability  RAM  Training
  • Author : Vincent R. Lalli
  • Publisher : Unknown
  • Release Date : 2000
  • Total pages : 366
  • ISBN : 1782422250
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Summary : The theme of this manual is failure physics - the study of how products, hardware, software, and systems fail and what can be done about it. The intent is to impart useful information, to extend the limits of production capability, and to assist in achieving low-cost reliable products. In a ...

IEEE International Reliability Physics Symposium Proceedings

IEEE International Reliability Physics Symposium Proceedings
  • Author : International Reliability Physics Symposium
  • Publisher : Unknown
  • Release Date : 2004
  • Total pages : 212
  • ISBN : 1782422250
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Summary : Read online IEEE International Reliability Physics Symposium Proceedings written by International Reliability Physics Symposium, published by which was released on 2004. Download full IEEE International Reliability Physics Symposium Proceedings Books now! Available in PDF, ePub and Kindle....

Thermal Analysis of Power Electronic Devices Used in Renewable Energy Systems

Thermal Analysis of Power Electronic Devices Used in Renewable Energy Systems
  • Author : Alhussein Albarbar,Canras Batunlu
  • Publisher : Springer
  • Release Date : 2017-07-19
  • Total pages : 218
  • ISBN : 1782422250
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Summary : This book analyzes the thermal characteristics of power electronic devices (PEDs) with a focus on those used in wind and solar energy systems. The authors focus on the devices used in such applications, for example boost converters and inverters under different operating conditions. The book explains in detail finite element ...

1997 IEEE International Conference on Microelectronic Systems Education MSE 97

1997 IEEE International Conference on Microelectronic Systems Education  MSE 97
  • Author : Anonim
  • Publisher : IEEE Computer Society
  • Release Date : 1997
  • Total pages : 154
  • ISBN : 1782422250
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Summary : This volume on computer hardware, and design and test covers topics including: needs and capabilities of MSE needs and expectations of industry; practical issues and solutions; and infrastructure....

1998 Fourth International High Temperature Electronics Conference

1998 Fourth International High Temperature Electronics Conference
  • Author : IEEE Electron Devices Society
  • Publisher : Institute of Electrical & Electronics Engineers(IEEE)
  • Release Date : 1998
  • Total pages : 332
  • ISBN : 1782422250
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Summary : These papers discuss the need for and status of high temperature electronics development with particular reference to semiconductor materials, devices and applications, passive components, ohmic contacts and metallizations, testing at high temperatures, and thermal management....

5th Electronics Packaging Technology Conference

5th Electronics Packaging Technology Conference
  • Author : Mahadevan K. Iyer,Kok Chuan Toh
  • Publisher : IEEE Computer Society Press
  • Release Date : 2003
  • Total pages : 827
  • ISBN : 1782422250
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Summary : Read online 5th Electronics Packaging Technology Conference written by Mahadevan K. Iyer,Kok Chuan Toh, published by IEEE Computer Society Press which was released on 2003. Download full 5th Electronics Packaging Technology Conference Books now! Available in PDF, ePub and Kindle....

Proceedings of the IEEE 1978 National Aerospace and Electronics Conference NAECON 78 Held at the Dayton Convention Center May 16 18 1978

Proceedings of the IEEE 1978 National Aerospace and Electronics Conference  NAECON  78  Held at the Dayton Convention Center  May 16 18  1978
  • Author : Anonim
  • Publisher : Unknown
  • Release Date : 1978
  • Total pages : 1376
  • ISBN : 1782422250
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Summary : Read online Proceedings of the IEEE 1978 National Aerospace and Electronics Conference NAECON 78 Held at the Dayton Convention Center May 16 18 1978 written by , published by which was released on 1978. Download full Proceedings of the IEEE 1978 National Aerospace and Electronics Conference NAECON 78 Held at the Dayton Convention Center May 16 18 1978 Books now! Available in ...

Reliability Testing and Characterization of MEMS MOEMS

Reliability  Testing  and Characterization of MEMS MOEMS
  • Author : Anonim
  • Publisher : Unknown
  • Release Date : 2001
  • Total pages : 212
  • ISBN : 1782422250
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Summary : Read online Reliability Testing and Characterization of MEMS MOEMS written by , published by which was released on 2001. Download full Reliability Testing and Characterization of MEMS MOEMS Books now! Available in PDF, ePub and Kindle....

Design and Characterization of Flip chip Bonded Si PLZT Smart Pixels

Design and Characterization of Flip chip Bonded Si PLZT Smart Pixels
  • Author : Barmak Mansoorian
  • Publisher : Unknown
  • Release Date : 1994
  • Total pages : 248
  • ISBN : 1782422250
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Summary : Read online Design and Characterization of Flip chip Bonded Si PLZT Smart Pixels written by Barmak Mansoorian, published by which was released on 1994. Download full Design and Characterization of Flip chip Bonded Si PLZT Smart Pixels Books now! Available in PDF, ePub and Kindle....

International Integrated Reliability Workshop Final Report

International Integrated Reliability Workshop Final Report
  • Author : Anonim
  • Publisher : Unknown
  • Release Date : 2005
  • Total pages : 212
  • ISBN : 1782422250
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Summary : Read online International Integrated Reliability Workshop Final Report written by , published by which was released on 2005. Download full International Integrated Reliability Workshop Final Report Books now! Available in PDF, ePub and Kindle....