New Approaches to Image Processing based Failure Analysis of Nano Scale ULSI Devices

Written By Zeev Zalevsky
New Approaches to Image Processing based Failure Analysis of Nano Scale ULSI Devices
  • Publsiher : William Andrew
  • Release : 13 November 2013
  • ISBN : 0128000171
  • Pages : 110 pages
  • Rating : /5 from reviews
GET THIS BOOKNew Approaches to Image Processing based Failure Analysis of Nano Scale ULSI Devices


Download or read book entitled New Approaches to Image Processing based Failure Analysis of Nano Scale ULSI Devices by author: Zeev Zalevsky which was release on 13 November 2013 and published by William Andrew with total page 110 pages . This book available in PDF, EPUB and Kindle Format. New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can’t keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise. This book presents novel "smart" image processing methods, applications, and case studies concerning quality improvement of microscope images of microelectronic chips and process optimization. It explains an approach for high-resolution imaging of advanced metallization for micro- and nanoelectronics. This approach obviates the time-consuming preparation and selection of microscope measurement and sample conditions, enabling not only better electron-microscopic resolution, but also more efficient testing and quality control. This in turn leads to productivity gains in design and development of nano-scale ULSI chips. The authors also present several approaches for super-resolving low-resolution images to improve failure analysis of microelectronic chips. Acquaints users with new software-based approaches to enhance high-resolution microscope imaging of microchip structures Demonstrates how these methods lead to productivity gains in the development of ULSI chips Presents several techniques for the superresolution of images, enabling engineers and scientists to improve their results in failure analysis of microelectronic chips

New Approaches to Image Processing based Failure Analysis of Nano Scale ULSI Devices

New Approaches to Image Processing based Failure Analysis of Nano Scale ULSI Devices
  • Author : Zeev Zalevsky,Pavel Livshits,Eran Gur
  • Publisher : William Andrew
  • Release Date : 2013-11-13
  • Total pages : 110
  • ISBN : 0128000171
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Summary : New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can’t keep pace with the continuous shrinking ...

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Handbook of Silicon Based MEMS Materials and Technologies
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  • Publisher : William Andrew
  • Release Date : 2015-09-02
  • Total pages : 826
  • ISBN : 0128000171
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Summary : The Handbook of Silicon Based MEMS Materials and Technologies, Second Edition, is a comprehensive guide to MEMS materials, technologies, and manufacturing that examines the state-of-the-art with a particular emphasis on silicon as the most important starting material used in MEMS. The book explains the fundamentals, properties (mechanical, electrostatic, optical, etc.), ...

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  • Author : Anonim
  • Publisher : ASM International
  • Release Date : 2004-01-01
  • Total pages : 800
  • ISBN : 0128000171
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Summary : For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was ...

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  • Publisher : Springer Science & Business Media
  • Release Date : 2009-09-19
  • Total pages : 552
  • ISBN : 0128000171
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Summary : In Advanced ULSI interconnects – fundamentals and applications we bring a comprehensive description of copper-based interconnect technology for ultra-lar- scale integration (ULSI) technology for integrated circuit (IC) application. In- grated circuit technology is the base for all modern electronics systems. You can ?nd electronics systems today everywhere: from toys and home ...

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  • Publisher : American Institute of Physics
  • Release Date : 2005-09-29
  • Total pages : 667
  • ISBN : 0128000171
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Summary : The worldwide semiconductor community faces increasingly difficult challenges in the era of silicon nanotechnology and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Characterization and metrology ...

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Summary : Read online International Aerospace Abstracts written by , published by which was released on 1998. Download full International Aerospace Abstracts Books now! Available in PDF, ePub and Kindle....

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Summary : Read online Electrical Electronics Abstracts written by , published by which was released on 1997. Download full Electrical Electronics Abstracts Books now! Available in PDF, ePub and Kindle....

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  • Publisher : American Institute of Physics
  • Release Date : 2003-10-08
  • Total pages : 818
  • ISBN : 0128000171
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Summary : The worldwide semiconductor community faces increasingly difficult challenges as it moves into the manufacturing of chips with feature sizes approaching 100 nm and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology ...

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  • ISBN : 0128000171
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Summary : Read online Istfa 2005 written by ASM International, published by ASM International which was released on 2005-01-01. Download full Istfa 2005 Books now! Available in PDF, ePub and Kindle....

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