Electromigration in Thin Films and Electronic Devices

Written By Choong-Un Kim
Electromigration in Thin Films and Electronic Devices
  • Publsiher : Elsevier
  • Release : 28 August 2011
  • ISBN : 0857093754
  • Pages : 352 pages
  • Rating : /5 from reviews
GET THIS BOOKElectromigration in Thin Films and Electronic Devices


Download or read book entitled Electromigration in Thin Films and Electronic Devices by author: Choong-Un Kim which was release on 28 August 2011 and published by Elsevier with total page 352 pages . This book available in PDF, EPUB and Kindle Format. Understanding and limiting electromigration in thin films is essential to the continued development of advanced copper interconnects for integrated circuits. Electromigration in thin films and electronic devices provides an up-to-date review of key topics in this commercially important area. Part one consists of three introductory chapters, covering modelling of electromigration phenomena, modelling electromigration using the peridynamics approach and simulation and x-ray microbeam studies of electromigration. Part two deals with electromigration issues in copper interconnects, including x-ray microbeam analysis, voiding, microstructural evolution and electromigration failure. Finally, part three covers electromigration in solder, with chapters discussing topics such as electromigration-induced microstructural evolution and electromigration in flip-chip solder joints. With its distinguished editor and international team of contributors, Electromigration in thin films and electronic devices is an essential reference for materials scientists and engineers in the microelectronics, packaging and interconnects industries, as well as all those with an academic research interest in the field. Provides up-to-date coverage of the continued development of advanced copper interconnects for integrated circuits Comprehensively reviews modelling of electromigration phenomena, modelling electromigration using the peridynamics approach and simulation, and x-ray microbeam studies of electromigration Deals with electromigration issues in copper interconnects, including x-ray microbeam analysis, voiding, microstructural evolution and electromigration failure

Electromigration in Thin Films and Electronic Devices

Electromigration in Thin Films and Electronic Devices
  • Author : Choong-Un Kim
  • Publisher : Elsevier
  • Release Date : 2011-08-28
  • Total pages : 352
  • ISBN : 0857093754
GET BOOK

Summary : Understanding and limiting electromigration in thin films is essential to the continued development of advanced copper interconnects for integrated circuits. Electromigration in thin films and electronic devices provides an up-to-date review of key topics in this commercially important area. Part one consists of three introductory chapters, covering modelling of electromigration ...

Metal Based Thin Films for Electronics

Metal Based Thin Films for Electronics
  • Author : Klaus Wetzig,Claus M. Schneider
  • Publisher : John Wiley & Sons
  • Release Date : 2006-03-06
  • Total pages : 388
  • ISBN : 0857093754
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Summary : This up-to-date handbook covers the main topics of preparation, characterization and properties of complex metal-based layer systems. The authors -- an outstanding group of researchers -- discuss advanced methods for structure, chemical and electronic state characterization with reference to the properties of thin functional layers, such as metallization and barrier ...

Electronic Thin Film Reliability

Electronic Thin Film Reliability
  • Author : King-Ning Tu
  • Publisher : Cambridge University Press
  • Release Date : 2010-11-25
  • Total pages : 212
  • ISBN : 0857093754
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Summary : Thin films are widely used in the electronic device industry. As the trend for miniaturization of electronic devices moves into the nanoscale domain, the reliability of thin films becomes an increasing concern. Building on the author's previous book, Electronic Thin Film Science by Tu, Mayer and Feldman, and based on ...

Waste Electrical and Electronic Equipment WEEE Handbook

Waste Electrical and Electronic Equipment  WEEE  Handbook
  • Author : Vannessa Goodship,Ab Stevels
  • Publisher : Elsevier
  • Release Date : 2012-08-30
  • Total pages : 752
  • ISBN : 0857093754
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Summary : Electrical and electronic waste is a growing problem as volumes are increasing fast. Rapid product innovation and replacement, especially in information and communication technologies (ICT), combined with the migration from analog to digital technologies and to flat-screen televisions and monitors has resulted in some electronic products quickly reaching the end ...

Microcircuit Reliability Bibliography

Microcircuit Reliability Bibliography
  • Author : Anonim
  • Publisher : Unknown
  • Release Date : 1978
  • Total pages : 212
  • ISBN : 0857093754
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Summary : Read online Microcircuit Reliability Bibliography written by , published by which was released on 1978. Download full Microcircuit Reliability Bibliography Books now! Available in PDF, ePub and Kindle....

Electromigration in Thin Film Amorphous and Polycrystalline Alloys

Electromigration in Thin Film Amorphous and Polycrystalline Alloys
  • Author : Michael Francis Chisholm
  • Publisher : Unknown
  • Release Date : 1989
  • Total pages : 352
  • ISBN : 0857093754
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Summary : Read online Electromigration in Thin Film Amorphous and Polycrystalline Alloys written by Michael Francis Chisholm, published by which was released on 1989. Download full Electromigration in Thin Film Amorphous and Polycrystalline Alloys Books now! Available in PDF, ePub and Kindle....

Cities and Their Vital Systems

Cities and Their Vital Systems
  • Author : Advisory Committee on Technology and Society
  • Publisher : National Academies Press
  • Release Date : 1988-02-01
  • Total pages : 368
  • ISBN : 0857093754
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Summary : Cities and Their Vital Systems asks basic questions about the longevity, utility, and nature of urban infrastructures; analyzes how they grow, interact, and change; and asks how, when, and at what cost they should be replaced. Among the topics discussed are problems arising from increasing air travel and airport congestion; ...

Microstructural Science for Thin Film Metallizations in Electronic Applications

Microstructural Science for Thin Film Metallizations in Electronic Applications
  • Author : John Sanchez,David Anthony Smith,Nimal DeLanerolle
  • Publisher : Tms
  • Release Date : 1988
  • Total pages : 191
  • ISBN : 0857093754
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Summary : Read online Microstructural Science for Thin Film Metallizations in Electronic Applications written by John Sanchez,David Anthony Smith,Nimal DeLanerolle, published by Tms which was released on 1988. Download full Microstructural Science for Thin Film Metallizations in Electronic Applications Books now! Available in PDF, ePub and Kindle....

The Physical Properties of Thin Metal Films

The Physical Properties of Thin Metal Films
  • Author : G.P. Zhigal'skii,Brian K. Jones
  • Publisher : CRC Press
  • Release Date : 2003-07-10
  • Total pages : 232
  • ISBN : 0857093754
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Summary : Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important ...

Diffusion Phenomena in Thin Films and Microelectronic Materials

Diffusion Phenomena in Thin Films and Microelectronic Materials
  • Author : Devendra Gupta,P. S. Ho
  • Publisher : William Andrew
  • Release Date : 1988
  • Total pages : 588
  • ISBN : 0857093754
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Summary : A comprehensive review of diffusion phenomena in thin films and microelectronic materials -- theory and technology....

Thin Films

Thin Films
  • Author : Anonim
  • Publisher : Unknown
  • Release Date : 1998
  • Total pages : 212
  • ISBN : 0857093754
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Summary : Read online Thin Films written by , published by which was released on 1998. Download full Thin Films Books now! Available in PDF, ePub and Kindle....

Proceedings of the Symposium on Reliability of Metals in Electronics

Proceedings of the Symposium on Reliability of Metals in Electronics
  • Author : Hazara S. Rathore
  • Publisher : The Electrochemical Society
  • Release Date : 1995
  • Total pages : 245
  • ISBN : 0857093754
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Summary : Read online Proceedings of the Symposium on Reliability of Metals in Electronics written by Hazara S. Rathore, published by The Electrochemical Society which was released on 1995. Download full Proceedings of the Symposium on Reliability of Metals in Electronics Books now! Available in PDF, ePub and Kindle....

Electronic Devices and Materials 1984

Electronic Devices and Materials 1984
  • Author : L. J. Chen
  • Publisher : Unknown
  • Release Date : 1984
  • Total pages : 631
  • ISBN : 0857093754
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Summary : Read online Electronic Devices and Materials 1984 written by L. J. Chen, published by which was released on 1984. Download full Electronic Devices and Materials 1984 Books now! Available in PDF, ePub and Kindle....

Review of the Electrical Communication Laboratories

Review of the Electrical Communication Laboratories
  • Author : Denki Tsūshin Kenkyūjo (Japan)
  • Publisher : Unknown
  • Release Date : 1974
  • Total pages : 212
  • ISBN : 0857093754
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Summary : Consists of abstracts of various of the Laboratory's journals....

Concise Encyclopedia of Semiconducting Materials Related Technologies

Concise Encyclopedia of Semiconducting Materials   Related Technologies
  • Author : S. Mahajan,L. C. Kimerling
  • Publisher : Pergamon
  • Release Date : 1992
  • Total pages : 582
  • ISBN : 0857093754
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Summary : The development of electronic materials and particularly advances in semiconductor technology have played a central role in the electronics revolution by allowing the production of increasingly cheap and powerful computing equipment and advanced telecommunications devices. This Concise Encyclopedia, which incorporates relevant articles from the acclaimed Encyclopedia of Materials Science and ...